Table 5 in my report on Shard Calibrations
(Corrected 5 Feb. '97 for an omission of the
thickness increases due to tilts in the y axis.
Corrected again 21 Feb. '97 after improved
residual-energy results were calculated.)


t-range	m	b	rms
(µm)	(µm/MeV)	(µm)	(µm)

matrix	-1.5716	3384.0	0.714
100	-1.4381	3124.6	0.505
250	-1.6679	3593.0	0.725
500	-1.3618	2993.0	0.939
750	-1.2799	2857.8	0.787
900	-1.1242	2614.5	0.318
1000	-1.1569	2668.1	0.482


This table summarizes SIS shard measurements; i.e. 
empirical fits to thickness (t) vs residual energy (E').
Here, t = m*E' + b  where units are µm and MeV, 
and 'rms' is the root-mean-square deviation from 
these fits, made to all the data that survived cuts.
Different slopes (m) and offsets (b) must be used for
thicknesses in the ranges shown in the first column.  
The E' to be used in these fit equations must first be 
divided by the apparent gain efficiency observed at
that location in the E' map of the relevant stopping 
detector made without any intervening Si in place.
The secant(5 deg) increases have been included; i.e. 
the t's derived correspond to the actual thicknesses 
of silicon penetrated by the argon beam at MSU.